CPU voltage testing system and method thereof
Patent 8102180 Issued on January 24, 2012. Estimated Expiration Date: 
July 23, 2029. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
July 23, 2029. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.InventorAssigneeApplicationNo. 12507811 filed on 07/23/2009US Classes:324/522By voltage or current measuring , 324/762.01ExaminersPrimary: Koval, MelissaAssistant: Hoque, Farhana Attorney, Agent or FirmInternational ClassesG01R 31/02G01R 31/30 G01R 27/28 G06F 11/00 AbstractA CPU voltage testing system and method uses a parameter storing unit to store a number of VID codes and a plurality of allowable voltage ranges. A number of VID code control signals corresponding to the number of the VID codes are sent to a VID code coding unit to control a voltage converting module to output corresponding voltage signals to a CPU. A voltage collecting unit collects CPU core voltages of the CPU and outputs the collected CPU core voltages to a data processing unit. The data processing unit can determine whether the collected CPU core voltages are within the plurality of allowable voltage ranges via comparing with a number of testing parameters stored in the parameter storing unit.Field of SearchBy voltage or current measuringWith voltage or current signal evaluation Testing multiple circuits Signal generation or waveform shaping Signal conversion Performance or efficiency evaluation Diagnostic analysis Of processor DATA PROCESSING SYSTEM ERROR OR FAULT HANDLING Determination of marginal operation limits 324/762.01 | |
