Methods and apparatus for thermal development of large area solids
Patent 8043087 Issued on October 25, 2011. Estimated Expiration Date: October 11, 2026. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
Methods and apparatus to rotate a sample about first and second axes in a heat chamber to obtain a desired homogeneous modification of properties of the sample and maintain a surface figure.
Other References
Written Opinion of the International Searching Authority dated Mar. 9, 2008, PCT/US2007/021321.
The International Search Report, International filing date of Apr. 10, 2007, PCT/US2007/021321.
Notification of transmittal of the International Search Report dated Mar. 9, 2008, PCT/US2007/021321.
T. Cardinal, O.M. Efimov, H.G. Francois-Saint-Cyr, L.B. Glebov, L.N. Glebova, V.I. Smirnov, Comparative Study of Photo-Induced Variations of X-ray Diffraction and Refraction Index In Photo-Thermo-Refractive Glass, Journal of Non-Crystalline Solids 325 (2003) pp. 275-281.
PCT/US2007/021321 Partial International Search Report dated Jun. 6, 2008 (PCT Article 17(3)(a) and Rule 40.1).
Notification Concerning Transmittal of International Preliminary Report on Patentability (Chapter 1 of the Patent Cooperation Treaty) dated Apr. 23, 2009, International Preliminary Report on Patentability dated (Chapter 1 of the Patent Cooperation Treaty) Apr. 23, 2009, and the Written Opinion of the International Searching Authority, (PCT Rule 43bis.1) dated Sep. 3, 2008, PCT/US2007/021321.
Leonid B. Glebov, Volume Diffractive Elements in Photosensitive Inorganic Glass for Beam Combining, 2001, pp. 1-4, School of Optics/CREOL, University of Central Florida, Orlando, Florida.
Oleg M. Efimov, “Method and Apparatus for Recoding Holographic Diffraction Gratings”, U.S. Appl. No. 11/281,034, filed Nov. 17, 2005.
October 11, 2026. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
