Adaptive optics systems using pixilated microelectromechanical systems (MEMS)
Patent 7764417 Issued on July 27, 2010. Estimated Expiration Date: 
October 24, 2028. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 24, 2028. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesOptical pickup device Patent #: 6937381 InventorsAssigneeApplicationNo. 12258262 filed on 10/24/2008US Classes:359/279Phase modulationExaminersPrimary: Choi, William CAttorney, Agent or FirmInternational ClassesG02F 1/01G02B 27/14 AbstractAn adaptive optics system is provided, comprising a spatial light modulator configured to modulate an incoming beam with an aberrated wavefront, a beamsplitter configured to receive the modulated beam from the spatial light modulator and to divide the modulated beam into a measurement beam and a reference beam, a spatial filter configured to spatially filter the reference beam, and to interfere the spatially filtered reference beam with the measurement beam to form an interferogram, an imaging device configured to capture an image of the interferogram, and a processor configured to determine the aberrated wavefront and to provide control signals to the spatial light modulator to mitigate aberrations in the aberrated wavefront.Field of SearchBy changing physical characteristics (e.g., shape, size or contours) of an optical elementLight wave directional modulation (e.g., deflection or scanning is representative of the modulating signal) Plural modulation cells Beam splitter or combiner SINGLE CHANNEL SIMULTANEOUSLY TO OR FROM PLURAL CHANNELS (E.G., LIGHT DIVIDING, COMBINING, OR PLURAL IMAGE FORMING, ETC.) By partial reflection at beam splitting or combining surface By refraction at beam splitting or combining surface BY LIGHT INTERFERENCE (E.G., INTERFEROMETER) By wavefront detection | |
