U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Viscoelastic polisher and polishing method using the same

Patent 7527546 Issued on May 5, 2009. Estimated Expiration Date: Icon_subject July 9, 2024. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2819568

Composite polishing pad for semiconductor process
Patent #: 5212910
Issued on: 05/25/1993
Inventor: Breivogel, et al.

Method and apparatus for uniform polishing of a substrate
Patent #: 5558563
Issued on: 09/24/1996
Inventor: Cote, et al.

Polishing machine and method of dissipating heat therefrom
Patent #: 5718620
Issued on: 02/17/1998
Inventor: Tanaka, et al.

CMP platen with patterned surface
Patent #: 6220942
Issued on: 04/24/2001
Inventor: Tolles, et al.

Eliminating air pockets under a polished pad
Patent #: 6561891
Issued on: 05/13/2003
Inventor: Eppert, Jr., et al.

Fixed abrasive article for use in modifying a semiconductor wafer
Patent #: 6632129
Issued on: 10/14/2003
Inventor: Goetz

Through-pad drainage of slurry during chemical mechanical polishing
Patent #: 6692338
Issued on: 02/17/2004
Inventor: Kirchner

Profile control platen
Patent #: 6913518
Issued on: 07/05/2005
Inventor: Chen, et al.

Chemical mechanical polishing system
Patent #: 7134947
Issued on: 11/14/2006
Inventor: Stark, et al.

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Inventors

Assignee

Application

No. 10557018 filed on 07/09/2004

US Classes:

451/36Utilizing fluent abradant

Examiners

Primary: Eley, Timothy V

Attorney, Agent or Firm

Foreign Patent References

  • 54 027196 JP 09/01/1980
  • 62099072 JP 05/01/1987
  • 09277163 JP 10/01/1997
  • 09-295255 JP 11/01/1997
  • 2002307294 JP 10/01/2002
  • 2003048156 JP 02/01/2003
  • 2003103470 JP 04/01/2003

International Classes

B24B 1/00
B24D 11/00

Abstract

A viscoelastic polisher to be used for polishing. The viscoelastic polisher includes a viscoelastic layer provided on a major surface of a base disk and having a hole of a predetermined radius formed in a center portion thereof, and the base disk has a plurality of grooves equiangularly provided in the major surface thereof as extending radially outward from a center portion thereof. This arrangement ensures stable supply of an abrasive liquid, and obviates a need for formation of grooves in the viscoelastic layer.

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