U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method of producing a MEMS device

Patent 7416984 Issued on August 26, 2008. Estimated Expiration Date: Icon_subject August 9, 2024. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method for separating circuit dies from a wafer
Patent #: 5362681
Issued on: 11/08/1994
Inventor: Roberts, Jr., et al.

Apparatus and method for multi-axis capacitive sensing
Patent #: 5939633
Issued on: 08/17/1999
Inventor: Judy

Micromachined gyros Patent #: 6505511
Issued on: 01/14/2003
Inventor: Geen, et al.

Inventors

Assignee

Application

No. 10914576 filed on 08/09/2004

US Classes:

438/691, Combined mechanical and chemical material removal438/692, Simultaneous (e.g., chemical-mechanical polishing, etc.)438/702, Plural coating steps438/745, Liquid phase etching216/52, MECHANICALLY SHAPING, DEFORMING, OR ABRADING OF SUBSTRATE216/99Substrate contains silicon or silicon compound

Examiners

Primary: Tran, Binh X.

Attorney, Agent or Firm

Foreign Patent References

  • 0657759 EP 12/01/2001
  • WO 98/19337 WO 05/01/1998
  • WO 03/054927 WO 07/01/2003
  • WO 2004/035461 WO 04/01/2004

International Class

H01L 21/302

Abstract

A method of producing a MEMS device removes the bottom side of a device wafer after its movable structure is formed. To that end, the method provides the device wafer, which has an initial bottom side. Next, the method forms the movable structure on the device wafer, and then removes substantially the entire initial bottom side of the device wafer. Removal of the entire initial bottom side effectively forms a final bottom side.

Other References

  • Bharat Bhushan (Ed.), High Volume Manufacturing and Field Stability of MEMS Products, Spring Handbook, pp. 1087-1113, 2004.
  • North American Silicon Wafer Committee, SEMI M1-0704, Specifications for Polished Monocrystalline Silicon Wafers, pp. 1-27 & Appendices, 1978, 2001, 2004.
  • Authorized Officer Klaus Meierewert, The International Search Report and the Written Opinion of the International Searching Authority, Sep. 14, 2005, 13 pages.
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