Diagnostic compiler for pipeline analog-to-digital converter, method of compiling and test system employing the same
September 26, 2023. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2839744 3156899 3349195 3354452 Conversion characteristic test circuit for analog/digital converter and method thereof Cyclic analog-to-digital converter that reduces the accumulation of offset errors Pipeline analog-to-digital conversion that reduces the accumulation offset errors Low power serial analog-to-digital converter Method for automatically generating behavioral environment for model checking Using single lookup table to correct differential non-linearity errors in an array of A/D converters InventorAssigneeApplicationNo. 10672609 filed on 09/26/2003US Classes:702/86, Linearization of measurement341/118, CONVERTER COMPENSATION341/120, CONVERTER CALIBRATION OR TESTING703/2, MODELING BY MATHEMATICAL EXPRESSION703/13, SIMULATING ELECTRONIC DEVICE OR ELECTRICAL SYSTEM703/14, Circuit simulation703/17, Event-driven714/1, Reliability and availability341/140, Linearization (e.g., nonlinear transfer characteristic compensates for nonlinear transducer)713/401, Using delay324/537, Of individual circuit component or element341/163, Recirculating341/161, Acting sequentially714/32, Particular stimulus creation341/155, Analog to digital conversion341/156, Coarse and fine conversions717/149For a parallel or multiprocessor systemExaminersPrimary: Cosimano, Edward R.Attorney, Agent or FirmForeign Patent References
International ClassesH03M 1/10H03M 1/06 H03M 1/00 G06F 17/00 AbstractThe present invention is directed to a diagnostic compiler for use with a pipeline analog-to-digital converter (ADC) having code sequences corresponding to stages thereof. In one embodiment, the diagnostic compiler includes a transition locator configured to determine transition locations for the code sequences. The diagnostic compiler also includes a characteristics indicator coupled to the transition locator and configured to provide at least one characteristic of the ADC based on the transition locations.Other References
Field of SearchCONVERTER COMPENSATIONCONVERTER CALIBRATION OR TESTING Linearization (e.g., nonlinear transfer characteristic compensates for nonlinear transducer) CALIBRATION OR CORRECTION SYSTEM Linearization of measurement Error due to component compatibility Performance or efficiency evaluation Diagnostic analysis Reliability and availability Modeling MODELING BY MATHEMATICAL EXPRESSION SIMULATING ELECTRONIC DEVICE OR ELECTRICAL SYSTEM Circuit simulation Including logic Event-driven Event-driven Timing Target device Computer or peripheral device | |
