U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Methods, systems, and media for generating a regression suite database

Patent 7320090 Issued on January 15, 2008. Estimated Expiration Date: Icon_subject June 9, 2024. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

System and method for selecting test units to be re-run in software regression testing
Patent #: 5673387
Issued on: 09/30/1997
Inventor: Chen, et al.

Automated software regression test and compilation system
Patent #: 5694540
Issued on: 12/02/1997
Inventor: Humelsine, et al.

Computer system having improved regression testing
Patent #: 5778169
Issued on: 07/07/1998
Inventor: Reinhardt

Method for defining durable data for regression testing
Patent #: 6061643
Issued on: 05/09/2000
Inventor: Walker, et al.

Technology regression and verification acceptance method
Patent #: 6269457
Issued on: 07/31/2001
Inventor: Lane

Enhanced functional testing through the filtration of non-subtle mutations
Patent #: 6298317
Issued on: 10/02/2001
Inventor: Wiemann

Method and apparatus for automatically verifying communication software
Patent #: 6351826
Issued on: 02/26/2002
Inventor: Kato

Generating regression trees with oblique hyperplanes
Patent #: 6385607
Issued on: 05/07/2002
Inventor: Iyengar

Automatic generation and maintenance of regression test cases from requirements
Patent #: 6415396
Issued on: 07/02/2002
Inventor: Singh, et al.

Performing automated testing using automatically generated logs
Patent #: 6427000
Issued on: 07/30/2002
Inventor: Mumford, et al.

More ...

Inventors

Assignee

Application

No. 10864119 filed on 06/09/2004

US Classes:

714/30, Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)716/5, Design verification (e.g., wiring line capacitance, fan-out checking, minimum path width)716/6, Timing analysis (e.g., delay time, path delay, latch timing)714/38, Of computer software716/4Testing or evaluating

Examiners

Primary: Bonzo, Bryce P.

Attorney, Agent or Firm

Foreign Patent References

  • 1187097 EP 03/01/2002

International Class

G06F 11/00

Abstract

Methods, systems and media for generating an improved regression suite by applying harvesting models and/or regression algorithms to tests utilized in verification of a system are disclosed. In one embodiment, a regression manager responsive to user input may be coupled to a harvester module, an analysis module, and a management module. In one embodiment, the harvester module is responsive to harvesting models defined in a modeling language, where the harvester module is coupled to a regression suite database. In another embodiment, a regression methodology may be defined from a collection of regression strategies and each regression strategy may be defined from a combination of harvesting models and/or regression algorithms. A regression generator to receive tests, to apply one or more regression strategies to the tests, to provide reports, and to allow user control may also be provided.

Other References

  • Barret, A.; Baumgartner, J.; Mandymam, S.; & Raghavan, R.; “IBM Technical Diclosure Bulletin”, v40, n3, pp. 153-156 (Mar. 1997).
PatentsPlus Images
Enhanced PDF formats
loading...
PatentsPlus: add to cart
PatentsPlus: add to cartSearch-enhanced full patent PDF image
$9.95more info
PatentsPlus: add to cart
PatentsPlus: add to cartIntelligent turbocharged patent PDFs with marked up images
$18.95more info
 
Sign InRegister
Username  
Password   
forgot password?