Method and apparatus for testing driver circuits of AMOLED
Patent 7123043 Issued on October 17, 2006. Estimated Expiration Date: 
April 13, 2024. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
April 13, 2024. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and apparatus for measuring a deep impurity level of a semiconductor crystal Inspection apparatus of wiring board Patent #: 5740272 InventorsAssigneeApplicationNo. 10822750 filed on 04/13/2004US Classes:324/770, Liquid crystal device test324/752, Using light probe382/149, Fault or defect detection438/17, Electrical characteristic sensed345/84Light-controlling display elementsExaminersPrimary: Patel, RameshAssistant: Velez, Roberto Attorney, Agent or FirmInternational ClassG01R 31/00AbstractA method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the data line, the scan line, and the power line of an AMOLED, the present invention is able to input and retrieve signals from driver circuits for analyzing each of them is normal or not. | |
