Filter structure having combined wavelength and polarization sensitive characteristics
Infrared laser polarimeter
Apparatus and method for measuring the thickness of thin films
Method and apparatus for measuring angular velocity of a transparent object
Polarimeter Patent #: 6043887
ApplicationNo. 11089899 filed on 03/25/2005
US Classes:356/364, BY POLARIZED LIGHT EXAMINATION250/349, Plural signalling means250/338.1, Infrared responsive356/504, Refraction from surfaces of different refractive index356/366, With polariscopes356/459Rotation rate (e.g., ring laser gyros)
ExaminersPrimary: Turner, Samuel A.
Assistant: Akanbi, Isiaka O.
Attorney, Agent or Firm
International ClassG01J 4/00
AbstractA polarimeter simultaneously measures the Stokes vectors of a light beam using an optics unit with a slit with a slit axis, a foreoptics that focuses the light beam from the point location through the slit, a collimator that receives the light beam from the slit and collimates the light beam, a cylinder lens that receives the light beam from the collimator, wherein the cylinder lens has a cylindrical axis parallel to the slit axis, a re-imaging lens that images the light beam from the cylinder lens onto a focal plane, and a set of polarizing filters including three polarization filters having three different polarizations. The polarization filters are adjacent to each other in a direction perpendicular to the slit axis and lie between the cylinder lens and the focal plane so that the light beam is directed onto the set of polarizing filters.