Patent ReferencesQuality control using multi-process performance analysis Process control method for improving manufacturing operations Graphical display discriminant factor indicator for anomaly identification in semiconductor manufacture batch process Method for monitoring multivariate processes Inspection apparatus with real time display Patent #: 6097204 InventorsApplicationNo. 10617355 filed on 07/11/2003US Classes:700/109, Quality control700/83, Having operator control interface (e.g., control/display console)702/81, Quality evaluation715/772, Progress or activity indicator702/84, Quality control700/121, Integrated circuit production or semiconductor fabrication324/765, Test of semiconductor device702/182Performance or efficiency evaluationExaminersPrimary: Picard, Leo P.Assistant: Kosowski, Alexander Attorney, Agent or FirmInternational ClassG06F 19/00AbstractA graphical user interface for enabling a user to graphically observe on a displaying mechanism a statistical measure of the process quality of a manufacturing process provides for the display of an icon representing a workpiece. The location and color of the icon on the displaying mechanism indicates the process quality of the manufacturing process for the represented workpiece.Field of SearchOperator interface (e.g., display with control)Having operator control interface (e.g., control/display console) Quality control Integrated circuit production or semiconductor fabrication Quality evaluation Instrumentation and component modeling (e.g., interactive control panel, virtual device) Progress or activity indicator Non-array icons | |