Dispatch and/or disposition of material based upon an expected parameter result
September 27, 2022. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs Disposition tool for factory process control Semiconductor device manufacturing system and method of manufacturing semiconductor devices Yield prediction and statistical process control using predicted defect related yield loss Method for sorting integrated circuit devices System and software for statistical process control in semiconductor manufacturing and method thereof Patent #: 6727106 InventorsAssigneeApplicationNo. 10259064 filed on 09/27/2002US Classes:700/121, Integrated circuit production or semiconductor fabrication700/100, Job scheduling700/109, Quality control438/5, INCLUDING CONTROL RESPONSIVE TO SENSED CONDITION702/35, Flaw or defect detection702/82, Having judging means (e.g., accept/reject)716/4, Testing or evaluating209/573, Electrical component tested706/45, KNOWLEDGE PROCESSING SYSTEM703/2MODELING BY MATHEMATICAL EXPRESSIONExaminersPrimary: Rodriguez, SaulAttorney, Agent or FirmInternational ClassesG06F019/00H01L021/00 AbstractA method and an apparatus for affecting dispatch and/or disposition of a workpiece. A process step upon a workpiece is performed based upon a predetermined routing plan. An end-of-line parameter is modeled based upon the process performed upon the workpiece. A workpiece routing/disposition process is performed based upon modeling an end-of-line (EOL) parameter. The workpiece routing/disposition process includes using a controller to modify the routing plan.Field of SearchIntegrated circuit production or semiconductor fabricationIntegrated system (Computer Integrated Manufacturing (CIM) Resource allocation Job scheduling Constraints or rules Knowledge based (e.g., expert system) Quality control Defect analysis or recognition Having identification controlled manufacturing operation Associating or disassociating plural articles REPAIR OR RESTORATION INCLUDING CONTROL RESPONSIVE TO SENSED CONDITION | |
