U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Three-dimensional integrated semiconductor devices

Patent 6943067 Issued on September 13, 2005. Estimated Expiration Date: Icon_subject September 30, 2022. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Process for producing a three-dimensional semiconductor device
Patent #: 4489478
Issued on: 12/25/1984
Inventor: Sakurai

Stacked semiconductor device
Patent #: 5128732
Issued on: 07/07/1992
Inventor: Sugahara, et al.

Multi-layer type semiconductor device with semiconductor element layers stacked in opposite direction and manufacturing method thereof
Patent #: 5324980
Issued on: 06/28/1994
Inventor: Kusunoki

Method of making a three-dimensional integrated circuit
Patent #: 5563084
Issued on: 10/08/1996
Inventor: Ramm, et al.

Ultra high density inverter using a stacked transistor arrangement
Patent #: 6075268
Issued on: 06/13/2000
Inventor: Gardner, et al.

Elevated transistor fabrication technique Patent #: 6420730
Issued on: 07/16/2002
Inventor: Gardner, et al.

Inventor

Assignee

Application

No. 10260840 filed on 09/30/2002

US Classes:

438/152, Combined with electrical device not on insulating substrate or layer438/18, Utilizing integral test element257/353, Single crystal islands of semiconductor layer containing only one active device257/74, Plural recrystallized semiconductor layers (e.g., "3-dimensional integrated circuit")257/327, Short channel insulated gate field effect transistor257/67In combination with device formed in single crystal semiconductor material (e.g., stacked FETs)

Examiners

Primary: Nelms, David C.
Assistant: Hoang, Quoc

Attorney, Agent or Firm

Foreign Patent References

  • 3586732 DE 04/01/1993
  • 4427516 DE 02/01/1996
  • 19543540 DE 11/01/1996
  • 19849586 DE 05/01/2000
  • 0 374 971 EP 06/01/1990
  • 0 703 619 EP 03/01/1996
  • WO93/16491 WO 08/01/1993

International Class

H01L021/00

Abstract

The present invention describes a process for three-dimensional integration of semiconductor devices and a resulting device. The process combines low temperature wafer bonding methods with backside/substrate contact processing methods, preferably with silicon on insulator devices. The present invention utilizes, in an inventive fashion, low temperature bonding processes used for bonded silicon on insulator (SOI) wafer technology. This low temperature bonding technology is adopted for stacking several silicon layers on top of each other and building active transistors and other circuit elements in each one. The back-side/substrate contact processing methods allow the interconnection of the bonded SOI layers.

Other References

  • Patent Abstracts of Japan, Publication No. 2001326326 (Nov. 22, 2001).
  • Patent Abstracts of Japan, Publication No. 2001237370 (Aug. 31, 2001).
  • Patent Abstracts of Japan, Publication No. 2001160612 (Jun. 12, 2001).
  • Keyes, “Fundamental Limits in Digital Information Processing,” Proceedings of the IEEE, 69:267-78, 1981.
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