U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Sensing circuit

Patent 6912167 Issued on June 28, 2005. Estimated Expiration Date: Icon_subject June 25, 2023. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Charge-integrating preamplifier for ferroelectric memory
Patent #: 5274583
Issued on: 12/28/1993
Inventor: Rapp

Semiconductor memory device
Patent #: 5311469
Issued on: 05/10/1994
Inventor: Hoshi, et al.

Column amplifier for high fixed pattern noise reduction
Patent #: 6128039
Issued on: 10/03/2000
Inventor: Chen, et al.

Nonvolatile ferroelectric memory device and method for driving same
Patent #: 6333870
Issued on: 12/25/2001
Inventor: Kang

Charge amplifier for MOS imaging array
Patent #: 6351283
Issued on: 02/26/2002
Inventor: Liu

Integrated memory having memory cells with magnetoresistive storage effect
Patent #: 6462979
Issued on: 10/08/2002
Inventor: Schlosser, et al.

Ferroelectric memory and method for reading the same Patent #: 6522568
Issued on: 02/18/2003
Inventor: Nair

Inventor

Assignee

Application

No. 10602739 filed on 06/25/2003

US Classes:

365/207, Differential sensing365/189.09, Including reference or bias voltage generator348/294, Solid-state image sensor365/145, Ferroelectric348/301, Pixel amplifiers365/158Magnetoresistive

Examiners

Primary: Le, Vu A.

Attorney, Agent or Firm

Foreign Patent References

  • 195 06 134 DE 09/01/1995
  • A 9-91970 JP 04/01/1997
  • WO 02/17322 WO 02/01/2002
  • WO 02/017322 WO 02/01/2002

International Class

G11C007/00

Abstract

A sensing circuit comprises a charge integrating sense amplifier 4 serially coupled to a discriminator 6. The sensing circuit can be used to sense the logic status of the cells in a random access memory (RAM) system, including ferroelectric RAMs. The use of a charge integrating sense amplifier enables the effect of bit line capacitance intrinsic to RAM circuits to be overcome and also provides efficient charge to voltage conversion gain.

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