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US Patent 6822731 - Method and apparatus for a pellicle frame with heightened bonding surfaces

US Patent Issued on November 23, 2004
Estimated Patent Expiration Date: Icon_subject June 18, 2023Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
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Abstract

A method and apparatus for maintaining an optical gap between optical structures in a photolithography system is described. A frame defines first and second opposing surfaces. The first opposing surface defines a first opening and the second opposing surface defines a second opening. A plurality of spacing members are spaced apart on the first opposing surface around the first opening. The spacing members have substantially co-planar surfaces configured to mate with a surface of a first optical structure. A bonding agent seals a space around the first opening between the first opposing surface and the first optical structure. The frame thereby encloses the optical gap between the first optical structure and a second optical structure.

Other References

  • Thomas Register, Companies Found, Search Path: porous:Metals; Porous: 38 companies found (visited Dec. 27, 1999) http://www.5.thomasregister.com, 2 pages.
  • Filter Technology: Functional porosity for high-performance applications (visited Dec. 27, 1999) http://www.gknsintermetals.com/filter_technology.html, 2 pages.
  • Patent Abstracts of Japan, vol. 011, JP 09 197652A, published Jul. 31, 1997.
  • Patent Abstracts of Japan, vol. 015, No. 410 (P-1264), JP 03 166545A, published Jul. 18, 1991.
  • Patent Abstracts of Japan, vol. 016, No. 521 (E-1285), JP 04 196117A, published Jul. 15, 1992.
  • Patent Abstracts of Japan, vol. 017, No. 060 (P-1482), JP 04 269752A, published Sep. 25, 1992.
  • Patent Abstracts of Japan, vol. 018, No. 096 (p-1694), JP 05 297572 A, published Nov. 12, 1993.
  • Copy of International Search Report issued Mar. 19, 2001 for PCT/US00/30432, 7 pages.
  • Patent Abstracts of Japan, JP 04 196117, published Jul. 15, 1992.

Inventors

Assignee

Application

No. 10464840 filed on 06/18/2003

US Classes:

355/75, Detailed holder for original355/53, Step and repeat355/72Detailed holder for photosensitive paper

Field of Search

355/53, Step and repeat310/310, Friction310/12, Linear318/649, Stable platforms378/34, Lithography378/35, Pattern mask430/5, Radiation mask430/20, LIQUID CRYSTAL PROCESS, COMPOSITION, OR PRODUCT430/30INCLUDING CONTROL FEATURE RESPONSIVE TO A TEST OR MEASUREMENT

Examiners

Primary: Nguyen, Henry Hung

Attorney, Agent or Firm

US Patent References

4719705, Reticle transporter
Issued on: 01/19/1988
Inventor: Laganza ,   et al.
4986007, Reticle frame assembly
Issued on: 01/22/1991
Inventor: Laganza, et al.
5487771, High-efficiency metal membrane element, filter, and process for making
Issued on: 01/30/1996
Inventor: Zeller
5691088, Pellicle for protection of photolithographic mask
Issued on: 11/25/1997
Inventor: Kubota, et al.
5727685, Reticle container with corner holding
Issued on: 03/17/1998
Inventor: Laganza, et al.
5814381, Pellicle assembly having a vented frame
Issued on: 09/29/1998
Inventor: Kuo
6101237, X-ray mask and X-ray exposure method using the same
Issued on: 08/08/2000
Inventor: Miyachi, et al.
6192100, X-ray mask pellicles and their attachment in semiconductor manufacturing
Issued on: 02/20/2001
Inventor: Acosta, et al.
6216873, SMIF container including a reticle support structure
Issued on: 04/17/2001
Inventor: Fosnight, et al.
6507390Method and apparatus for a reticle with purged pellicle-to-reticle gap
Issued on: 01/14/2003
Inventor: Ivaldi

Foreign Patent References

  • 0 696 760 EP 02/01/1996

International Classes

G03B 2762
G03B 2742
G03B 2758
G03F 114

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