Patent ReferencesMethod for controlling semiconductor wafer processing C-V method to extract lateral channel doping profiles of MOSFETs Method for identifying and controlling impact of ambient conditions on photolithography processes Method for efficient manufacturing of integrated circuits Incorporation of critical dimension measurements as disturbances to lithography overlay run to run controller Method and apparatus for monitoring controller performance using statistical process control Automated process monitoring and analysis system for semiconductor processing Patent #: 6622059 InventorApplicationNo. 10150988 filed on 05/17/2002US Classes:700/121, Integrated circuit production or semiconductor fabrication700/29, Having model700/103, Constraints or rules703/6SIMULATING NONELECTRICAL DEVICE OR SYSTEMExaminersPrimary: Gandhi, Jayprakash N.Attorney, Agent or FirmInternational ClassG06F 1900AbstractSystems and methods of modeling a best-guess semiconductor process flow for fabricating a desired semiconductor device are provided. The best-guess process flow is modeled using an inverse modeling technique. This technique reverse engineers a desired semiconductor device to synthesize a model of a fabrication process that is likely to produce the desired semiconductor device. First, a desired device having one or more desired characteristics is modeled. Then, various process and material parameters, constraints, and actual measured data are used to synthesize one or more unique software models that represent a process flow likely to fabricate the desired device. If more than one process flow is modeled, various parameters are modified iteratively until a unique process flow model is synthesized.Other References
Field of SearchSPECIFIC APPLICATION, APPARATUS OR PROCESSProduct assembly or manufacturing Constraints or rules Performance monitoring Integrated circuit production or semiconductor fabrication Optimization or adaptive control Having model Quality control WITH MEASURING OR TESTING Software program (i.e., performance prediction) SIMULATING NONELECTRICAL DEVICE OR SYSTEM | |