Method for analyzing reflection curvature in seismic data volumes
June 25, 2022. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and apparatus for identifying fault curves in seismic data Migration process using a model based aperture technique Process for seismic imaging measurement and evaluation of three-dimensional subterranean common-impedance objects Method and apparatus for processing at least two seismic data sets during a step to derive a third data set Method of seismic attribute generation and seismic exploration Method and apparatus for automatically identifying fault cuts in seismic data using a horizon time structure Automated seismic fault detection and picking Method of prestack 3-D migration Spectral decomposition for seismic interpretation Automatic non-artificially extended fault surface based horizon modeling system InventorsAssigneeApplicationNo. 10/179631 filed on 06/25/2002US Classes:702/14, Seismology702/16Specific display system (e.g., mapping, profiling)ExaminersPrimary: Hoff, Marc S.Assistant: Gutierrez, Anthony Attorney, Agent or FirmInternational ClassesG01V 1/30 (20060101)G01V 1/28 (20060101) AbstractA method of calculating reflection curvature in a seismic data volume wherein an apparent dip value is calculated in a first direction to generate a first apparent dip volume. A horizontal gradient is calculated in the first direction in the first apparent dip volume using a specified length scale to generate a first curvature volume. The process may be repeated one or more times, and the individual curvature volumes combined to generate a combined curvature volume for the seismic data volume.Other References
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