Coverage-based test generation for microprocessor verification
May 25, 2020. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesEfficient regression verification Integrated circuit tester having pattern generator controlled data bus Error generation circuit for testing a digital bus Assembly and method for testing integrated circuit devices Pattern generator for semiconductor test system Method of performing an extensive diagnostic test in conjunction with a bios test routine Error generation circuit for testing a digital bus Patent #: 6049894 InventorApplicationNo. 09/578743 filed on 05/25/2000US Classes:714/37, Analysis (e.g., of output, state, or design)714/33, Derived from analysis (e.g., of a specification or by stimulation)714/47Performance monitoring for fault avoidanceExaminersPrimary: Iqbal, NadeemAssistant: Bonura, Timothy M. Attorney, Agent or FirmInternational ClassesG06F 11/00 (20060101)G06F 17/50 (20060101) AbstractAn integrated circuit verification method and system are disclosed. The method includes generating a test description comprising a set of test cases. The functional coverage achieved by the test description is then determined. The functional coverage achieved is then compared against previously achieved functional coverage and the test description is modified prior to simulation if the test description achieves no incremental functional coverage. In one embodiment, generating the test description comprises generating a test specification and providing the test specification to a test generator suitable for generating the test description. In one embodiment, the test description comprises a generic test description and the generic test description is formatted according to a project specification and simulation environment requirements. If the coverage achieved by the test description satisfies the test specification. In one embodiment, the functional coverage achieved by the test description is displayed in a graphical format. The test description is preferably added to a test database if the coverage achieved by the test description satisfies the test specification. The attributes and description of functional coverage achieved is added to the coverage database. Determining the functional coverage achieved by a test description may include estimating the coverage achieved based upon the test description, the test specification, and functional coverage model.Field of SearchMonitor recognizes sequence of events (e.g., protocol or logic state analyzer)For reliability enhancing component (e.g., testing backup spare, or fault injection) Analysis (e.g., of output, state, or design) Particular stimulus creation Fault locating (i.e., diagnosis or testing) Performance monitoring for fault avoidance Derived from analysis (e.g., of a specification or by stimulation) | |
