U.S. patents available from 1976 to present.
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Method and system for using error and filter layers in each DRC rule

Patent 6606735 Issued on August 12, 2003. Estimated Expiration Date: Icon_subject October 14, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Layout pattern generation and geometric processing system for LSI circuits
Patent #: 5062054
Issued on: 10/29/1991
Inventor: Kawakami, et al.

Method and system for user programmable design verification for printed circuit boards and multichip modules
Patent #: 5590049
Issued on: 12/31/1996
Inventor: Arora

Methods and apparatus for design rule checking Patent #: 6275971
Issued on: 08/14/2001
Inventor: Levy, et al.

Inventors

Application

No. 418669 filed on 10/14/1999

US Classes:

716/5, Design verification (e.g., wiring line capacitance, fan-out checking, minimum path width)716/6Timing analysis (e.g., delay time, path delay, latch timing)

Examiners

Primary: Niebling, John F.
Assistant: Whitmore, Stacy

Attorney, Agent or Firm

Foreign Patent References

  • 404196237 JP. 04/13/1992
  • 408101859 JP. 08/13/1996

International Class

G06K 017/56

Abstract

A method automatically specifies a unique number of an error layer for each DRC rule in a runset. Therefore, all errors related to a given DRC rule are reported by a layout verification tool in the uniquely specified error layer. Furthermore, the method also automatically specifies a unique number of a filter layer that has the same extent as a quality assurance (QA) cell for testing the DRC rule. The filter layer is logically operated (e.g. ANDed) with the error layer to uniquely identify a failure related to the DRC rule (i.e. errors from all other QA cells are filtered out). The QA cells are generated automatically by use of a library of templates. During regression testing, the first time a DRC runset is run against a test design or QA cell library the results are manually verified and stored as "expected" results. Thereafter when the runset changes or a new version of the verification tool becomes available the test data may be used to identify any differences in the new results, by automatic comparison with the expected results. Specifically, the regression testing method graphically compares the new test results with the expected results and highlights the differences. A utility automatically compares a first set and a second set of shapes in the two sets of results, and can be used for comparison of any two drawings (not necessarily integrated circuit layouts).

Other References

  • McCollister, MJ, et al., "The use of inverse layout trees for hierarchical design verification", Nov. 1999, IEEE, p. 534-537.
  • Hedenstierna, N, et al., "The development of a first pass verification module for a SAW filter design automation sustem", Dec. 1991, IEEE, p. 133-136.
  • Bamji, CS, et al., "GLOVE: a graph-based layout verifier", Jan. 1994, IEEE, p. 215-220.
  • http://www.adiva.com, "DRC--Design Rule Check", Oct. 7, 1999, 2 pps
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  • http://www.avanticorp.com, "Advanced Verification Minimizes Time to Market", Electronics Journal Technical, Apr. 1999, 2 pps
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  • Weste, "Principles of CMOS VLSI Design. A Systems Perspective", 2 Ed., 1993, 5 pp
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