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US Patent 6581821 - Electronic package interconnect structure comprising lead-free solders

US Patent Issued on June 24, 2003
Estimated Patent Expiration Date: Icon_subject July 16, 2022Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
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Abstract

A method and structure for forming an electronic package with an interconnect structure that comprises lead-free solders. The method first forms a module by initially providing a chip carrier, a first joiner solder that is lead-free, and a core interconnect (e.g., solder ball, solder column) that includes a lead-free core solder. The liquidus temperature T1L of the first joiner solder is less than a solidus temperature TCS of the core solder. A first end of the core interconnect is soldered to the chip carrier with the first joiner solder, which includes reflowing the first joiner solder at a reflow temperature that is above T1L and below TCS, followed by cooling the first joiner solder to a temperature that is below a solidus temperature of the first joiner solder. Thus, the module with the soldered core interconnect has been formed. The method then provides a circuit card and a second joiner solder that is lead-free. The liquidus temperature T2L of the second joiner solder is less than TCS. A second end of the core interconnect is soldered to the circuit card with the second joiner solder, which includes reflowing the second joiner solder at a reflow temperature that is above T2L and below TCS, followed by cooling the second joiner solder to a lower temperature that is below a solidus temperature of the second joiner solder.

Other References

  • Circuits Assembly, May 2000, vol. 11, No. 5, Research Update: Lead-Free Solder Alternatives, Bath et al., 7 pages
  • Hanson, M., Constitution of Binary Alloys, 1985, Genium (No month) Publishing Corporation, 4 page

Inventor

Application

No. 197291 filed on 07/16/2002

US Classes:

228/180.21, Component terminal to substrate surface (i.e., nonpenetrating terminal)228/180.22, Lead-less (or "bumped") device257/E23.023, Consisting of soldered or bonded constructions (EPO)257/E23.069Spherical bumps on substrate for external connection, e.g., ball grid arrays (BGA) (EPO)

Field of Search

228/180.21, Component terminal to substrate surface (i.e., nonpenetrating terminal)228/180.22Lead-less (or "bumped") device

Examiners

Primary: Lam, Cathy F.

Attorney, Agent or Firm

US Patent References

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Inventor: Behun, et al.
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Inventor: Melton, et al.
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Inventor: Slattery, et al.
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5573172, Surface mount stress relief hidden lead package device and method
Issued on: 11/12/1996
Inventor: Gore
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Inventor: Sarkhel, et al.
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Inventor: Takao, et al.
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Inventor: Yoo, et al.
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Inventor: Sarkhel, et al.
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Inventor: Yamaguchi, et al.
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Issued on: 11/23/1999
Inventor: Master, et al.
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Issued on: 01/04/2000
Inventor: Sarkhel, et al.
6056191, Method and apparatus for forming solder bumps
Issued on: 05/02/2000
Inventor: Brouillette, et al.
6224690, Flip-Chip interconnections using lead-free solders
Issued on: 05/01/2001
Inventor: Andricacos, et al.
6297559, Structure, materials, and applications of ball grid array interconnections
Issued on: 10/02/2001
Inventor: Call, et al.
6337445Composite connection structure and method of manufacturing
Issued on: 01/08/2002
Inventor: Abbott, et al.

International Class

B23K 031/02

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