Patent ReferencesContact pin subassembly Fluorescent lamp with spring-loaded terminal pins Electrical contact assembly for interconnecting test apparatus and the like Socket for IC and method for manufacturing IC 6193524 Arrangements relating to electrical connections between apparatuses containing electrical circuitry Solderless grid array connector Electrical connector having compressive conductive contacts IC socket and IC tester Patent #: 6464511 InventorApplicationNo. 027688 filed on 12/21/2001US Classes:439/840, Helically coiled spring forms securing part439/816, Spring actuated or resilient securing part439/824Spring-biased butt contactExaminersPrimary: Paumen, Gary F.International ClassH01R 013/33AbstractAn electrical connection between a vibratory rotation sensor and a hermetic header which makes use of a local interference fit to provide a high degree of mechanical isolation between the sensor and the header. The electrical connection includes an electrical pin extending from the header which is connected to the sensor through a coil spring. The pin includes an enlarged portion having a maximal dimension greater than an inner diameter of the coil spring to provide an interference fit between the coil spring and the pin. The degree of interference is variable controlled by selecting the dimensions of the enlarged portion of the pin and the coil spring. The degree of mechanical isolation between the header and sensor can also be chosen by selecting the location of the enlarged portion along a length of the pin. This provides a reliable electrical connection which maintains a high degree of mechanical isolation.Field of SearchHaving spring-biased, plunger-type contact movable along line parallel to longitudinal axis of engagementConductor is compressible and to be sandwiched between panel circuits Spring-biased butt contact Compression spring axis transverse of and intersecting conductor axis Helically coiled spring forms securing part Spring actuated or resilient securing part | |