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Calibration methods and systems for diffuse optical tomography and spectroscopy

Patent 6549284 Issued on April 15, 2003. Estimated Expiration Date: Icon_subject September 15, 2020. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Calibrated spectrographic imaging
Patent #: 5452723
Issued on: 09/26/1995
Inventor: Wu, et al.

Method for measuring internal information in scattering medium and apparatus for the same
Patent #: 5517987
Issued on: 05/21/1996
Inventor: Tsuchiya

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Patent #: 5625458
Issued on: 04/29/1997
Inventor: Alfano, et al.

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Issued on: 06/20/2000
Inventor: Hueber

Inventors

Assignee

Application

No. 662862 filed on 09/15/2000

US Classes:

356/446With diffusion

Examiners

Primary: Stafira, Michael P.

Attorney, Agent or Firm

International Class

G01N 021/47

Abstract

The invention features a calibration method for diffuse optical measurements that corrects transmittance measurements between a source and a detector for factors unrelated to sample properties. The calibration method is based on the same set of transmittance measurements that are subsequently corrected by the calibration and used in imaging and/or spectroscopy applications. The calibration method involves a forward calculation for each of multiple source-detector pairs based on an approximate model of the sample, and a minimization of an expression that depends on the forward calculations and the transmittance measurements to determine self-consistent coupling coefficients for every source-detector pair. Once the coupling coefficients have been determined, they can be used to correct the transmittance measurements. If desired, an inverse calculation can be performed on the corrected sample measurements to determine spatial variations in the optical properties of the sample. If necessary, the calibration can be repeated and iteratively improved, whereby the optical properties determined by the inverse calculation in an earlier iteration are used to improve the sample model for the forward calculation in a subsequent iteration.

Other References

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