Method and system for making optimal estimates of linearity metrics of analog-to-digital converters
Patent 6476741 Issued on November 5, 2002. Estimated Expiration Date: April 19, 2021. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
A method and system for making optimal estimates of linearity metrics of analog-to-digital converters. A model building phase and a production test strategy are employed. During the model-building phase, a linear model an analog-to-digital converter is constructed from a set of accurately measured transition code voltages for a set of training analog-to-digital converters. During a production test of an individual analog-to-digital converter, a ramp test signal is applied to the individual analog-to-digital converter, a histogram of codes is produced, and the transition code voltages for the individual analog-to-digital converter are estimated from the resulting histogram. Linearity characteristics of the individual analog-to-digital converter may then be computed.
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April 19, 2021. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
