Patent ReferencesDiagonostic service system for CT scanners Automated diagnostic system Fault detection and recovery device used in a radiation imaging information processing system Search and retrieval system Machine performance monitoring and fault classification using an exponentially weighted moving average scheme Support apparatus for use with radiation image information processing system Preventative maintenance and diagonstic system Integrated data collection and transmission for 9-1-1 calls for service Method and apparatus for moving large numbers of data files between computer systems using import and export processes employing a directory of file handles Method and apparatus for searching a database of records InventorsAssigneeApplicationNo. 058755 filed on 04/10/1998US Classes:700/79, Having protection or reliability feature382/141, Manufacturing or product inspection382/157, Network learning techniques (e.g., back propagation)702/179, Statistical measurement714/25, Fault locating (i.e., diagnosis or testing)714/26Artificial intelligence (e.g., diagnostic expert system)ExaminersPrimary: Trammell, James P.Assistant: Backer, Firmin Attorney, Agent or FirmInternational ClassG05B 009/02AbstractThis invention provides a system and method for integrating a plurality of diagnostic information from a multiple of sources. In this invention, there is a site specific database which contains site specific information for a machine. A plurality of diagnostic related information is obtained from the machine. A diagnostic router collects the site specific information for the machine and the plurality of diagnostic related information and generates a current incident record therefrom. An approved incident record database contains a plurality of approved incident records obtained from a plurality of machines. An integrator finds approved incident records from the approved incident record database that most closely match the current incident record.Field of SearchHaving protection or reliability featureFault locating (i.e., diagnosis or testing) Artificial intelligence (e.g., diagnostic expert system) Analysis (e.g., of output, state, or design) MISCELLANEOUS PLURAL PROCESSING SYSTEMS Signal processing (e.g., filter) Manufacturing or product inspection Network learning techniques (e.g., back propagation) Wear or deterioration evaluation Flaw or defect detection Statistical measurement Diagnostic analysis | |