Patent ReferencesSemiconductor memory and screening test method thereof RE37184 InventorsApplicationNo. 773606 filed on 02/02/2001US Classes:365/149, Capacitors365/203, Precharge365/230.06Particular decoder or driver circuitExaminersPrimary: Nelms, David C.Assistant: Auduong, Gene N. Attorney, Agent or FirmInternational ClassG11C 011/24Foreign Application Priority Data2000-02-07 JPAbstractA BL kicker circuit includes first capacitors each of which is connected at one end to a first bit line which is one of bit lines of a corresponding pair and commonly connected at the other end, second capacitors each of which is connected at one end to a second bit line which is the other one of the bit lines of a corresponding pair and commonly connected at the other end, a first driver circuit having an output node for a first signal connected to the common connection node of the other ends of the first capacitors, a second drive circuit having an output node for a second signal connected to the common connection node of the other ends of the second capacitors, and a switch circuit used as an equalizing circuit connected between the output node for the first signal and the output node for the second signal.Other References
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