Atomic focusers in electron microscopy
Patent 6448556 Issued on September 10, 2002. Estimated Expiration Date: 
June 14, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 14, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesElectron microscope Instrument and method for 3-dimensional atomic arrangement observation Patent #: 5475218 InventorsAssigneeApplicationNo. 645999 filed on 06/14/1999US Classes:250/311, Electron microscope type250/396RWITH CHARGED PARTICLE BEAM DEFLECTION OR FOCUSSINGExaminersPrimary: Berman, Jack I.Attorney, Agent or FirmForeign Patent References
International ClassesH01J 037/12H01J 037/28 AbstractIn electron microscopy, resolution is improved by using an atom or atom-array focuser, with the atom or atom array serving as an electrostatic lens at a focal plane of an electron beam probe having a beam size less than about 0.2 nm at the focal plane. An electrostatic lens can be included in ultra-high resolution microscopes wherein (i) in a linear atom array, the atoms are in alignment with the electron path, (ii) the distance between a sample and the electrostatic lens is adjustable, (iii) a two-dimensional focuser is used, (iv) a sample is at Fourier image distance from a two-dimensionally periodic focuser, (v) a two-dimensional detector or detector array is used, and/or (vi) the electron beam is scanned at the focal plane. | |
