Statistical process control integration systems and methods for monitoring manufacturing processes
January 9, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3751647 Printed wiring board inspection, work logging and information system Production system for manufacturing semiconductor devices Method of testing semiconductor wafers System for managing production of semiconductor devices Process control system with action logging Method and apparatus for data collection of testing and inspection of products made on a production assembly line Method for producing semiconductor devices Method for managing production line processes Cross-linking hardenable resin composition, metal laminates thereof and metal surface processing method therewith InventorsAssigneeApplicationNo. 005259 filed on 01/09/1998US Classes:700/108, Performance monitoring29/33M, Electrical connector or terminal29/564.7, And means to machine product29/566.1, Including severing means29/566.3, To trim electric component29/739, Means to fasten electrical component to wiring board, base, or substrate700/28, Optimization or adaptive control700/51, Statistical process control (SPC)700/52, Parameter estimation or identification700/110, Defect analysis or recognition700/117, Particular manufactured product or operation700/121, Integrated circuit production or semiconductor fabrication702/82, Having judging means (e.g., accept/reject)702/83, Sampling Inspection Plan702/84, Quality control702/179, Statistical measurement702/180, Histogram distribution702/181Probability determinationExaminersPrimary: Patel, RameshAttorney, Agent or FirmInternational ClassG06F 019/00AbstractA method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.Field of SearchOptimization or adaptive controlHaving model Comparison with model (e.g., model reference) Having adjustment of model (e.g., update) Specific criteria of system performance Fuzzy logic Statistical process control (SPC) Parameter estimation or identification Product assembly or manufacturing Integrated system (Computer Integrated Manufacturing (CIM) Performance monitoring Quality control Defect analysis or recognition Particular manufactured product or operation Integrated circuit production or semiconductor fabrication Having judging means (e.g., accept/reject) Sampling Inspection Plan Quality control Statistical measurement Histogram distribution Probability determination Means to fasten electrical component to wiring board, base, or substrate Including severing means And means to machine product Electrical connector or terminal | |
