Patent 6415276 Issued on July 2, 2002. Estimated Expiration Date: August 13, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
A method and an apparatus for diagnosis of sensors and/or processes through use of Bayesian belief networks. More specifically, the method and apparatus of the present invention achieve sensor and/or process fault detection, isolation, and accommodation.
Other References
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