High density EEPROM cell array with novel programming scheme and method of manufacture
Reduction of oxide stress through the use of forward biased body voltage
Biasing scheme to reduce stress on non-selected cells during read Patent #: 6147907
AbstractA method is provided to increase the speed of a non-volatile memory transistor by increasing the read channel current in the non-volatile memory transistor. This increase in speed is accomplished without increasing the VCC voltage supply source or decreasing the channel length of the non-volatile memory transistor. The increase in read channel current is accomplished by applying a low voltage to the substrate region of the non-volatile memory transistor, while grounding the source of the non-volatile memory transistor. If the non-volatile memory transistor is located in an array, the low voltage is applied to the sources and drains of non-volatile memory transistors on unselected bit lines to inhibit junction leakage channel current from these unselected non-volatile memory transistors.