U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method for automatic scheduling of production plan

Patent 6356797 Issued on March 12, 2002. Estimated Expiration Date: Icon_subject January 4, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Manufacturing management and apparatus for a semiconductor device
Patent #: 5375061
Issued on: 12/20/1994
Inventor: Hara, et al.

Scheduling for multi-task manufacturing equipment
Patent #: 5402350
Issued on: 03/28/1995
Inventor: Kline

Production management system and its application method
Patent #: 5442561
Issued on: 08/15/1995
Inventor: Yoshizawa, et al.

Method and system for dynamic dispatching in semiconductor manufacturing plants
Patent #: 5612886
Issued on: 03/18/1997
Inventor: Weng

Fuzzy logic method and system for adjustment of priority rating of work in process in a production line
Patent #: 5751580
Issued on: 05/12/1998
Inventor: Chi

Method and apparatus for scheduling work orders in a manufacturing process
Patent #: 5787000
Issued on: 07/28/1998
Inventor: Lilly, et al.

Method for allocating resources and processes for design and production plan scheduling Patent #: 5826236
Issued on: 10/20/1998
Inventor: Narimatsu, et al.

Inventors

Application

No. 224958 filed on 01/04/1999

US Classes:

700/101, Priority ordering700/99, Resource allocation702/118, Testing multiple circuits702/121Including multiple test instruments

Examiners

Primary: Grant, William
Assistant: Rodriguez, Saul

Attorney, Agent or Firm

International Class

G06F 019/00

Abstract

A method for automatic scheduling of a production plan. The automatic scheduling system arranges different kinds of production plans and defines a first priority lot, a second priority lot and a normal lot in testing factories. The testing processes of the first priority lot is to decide the testing machine first, then exchanged with a running lot on this testing machine when a test piece is completed. For the second priority lot, after decides the testing machine, the second priority lot is exchanged with a running lot on the testing machine when the running lot is completed. For the normal lot, the procedure is to check if the testing machine is available and need to be setup, then use a setup reduce method to reduce the setup frequency if more than one machine is available and needs to be setup. The key to reduce setup method selects the testing machine which has minimum impact for the subsequent testing lot to get efficient use of the testing machine.

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