U.S. patents available from 1976 to present.
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Process control using multiple detections

Patent 6266436 Issued on July 24, 2001. Estimated Expiration Date: Icon_subject April 9, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Control fault detection for machine recovery and diagnostics prior to malfunction
Patent #: 4514846
Issued on: 04/30/1985
Inventor: Federico ,   et al.

Method and apparatus for detecting the placement of components on absorbent articles
Patent #: 4837715
Issued on: 06/06/1989
Inventor: Ungpiyakul ,   et al.

Apparatus and method for cutoff register control for diaper machines
Patent #: 5045135
Issued on: 09/03/1991
Inventor: Meissner, et al.

System and method for detecting flaws in continuous web materials
Patent #: 5068799
Issued on: 11/26/1991
Inventor: Jarrett, Jr.

Formation testing with digital image analysis
Patent #: 5113454
Issued on: 05/12/1992
Inventor: Marcantonio, et al.

Internal expert system to aid in servicing
Patent #: 5138377
Issued on: 08/11/1992
Inventor: Smith, et al.

Print scanner
Patent #: 5181081
Issued on: 01/19/1993
Inventor: Suhan

Control unit having an inference function
Patent #: 5195029
Issued on: 03/16/1993
Inventor: Murai, et al.

Image forming apparatus with maintenance procedure
Patent #: 5200779
Issued on: 04/06/1993
Inventor: Nawata

Memory card features
Patent #: 5218406
Issued on: 06/08/1993
Inventor: Ebner

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Inventors

Assignee

Application

No. 289777 filed on 04/09/1999

US Classes:

382/141, Manufacturing or product inspection382/111, Textiles or clothing700/110, Defect analysis or recognition700/144, Yarn quality700/302, Specific application of positional responsive control system702/36, Location702/81, Quality evaluation702/123, Including program set up702/189Measured signal processing

Examiners

Primary: Noland, Tom

Attorney, Agent or Firm

Foreign Patent References

  • 2044792 CA 05/13/1992
  • 0 485 691 B1 EP 05/13/1992
  • 0 485 691 A2 EP 05/13/1992
  • 0 657 852 A2 EP 06/13/1995
  • 7-92103 JP. 04/13/1995
  • 7-89063 JP. 04/13/1995
  • 9081233 JP 03/13/1997
  • 10-86344 JP. 04/13/1998
  • 10-123066 JP. 05/13/1998
  • WO 93/07445 WO 04/13/1993
  • WO 97/24283 WO. 07/13/1997

International Classes

G06T 007/00
G01N 021/84
G01N 021/90
G06K 009/78
G06F 019/00

Abstract

Controlling processes comprising detecting and measuring a parameter, for example presence and location of an element of a good, with at least two determinations as representations of the target parameter, transmitting signals to the computer, and processing the signals to compare the parameter to acceptable conditions. The detection can include three or more replications, optionally each for at least two parameters, optionally using at least two different methods to analyze the signals. The invention contemplates detecting and analyzing the target parameters using two or more analytical tools within the respective image to detect a given component of the product, namely two or more measurements of the parameter on a single visual image. Analytical methods can include averaging the signals, determining the number of signals of common signal duration and/or signal characteristics, computing standard deviation, modifying the signal combination to compensate for an inappropriate signal, and/or comparing the signals to a database of signal combinations. The method can automatically compute probable cause of some anomalies in the signals, develop corresponding responses, and transmit responses to process control, and thence to control devices. The methods can automatically recalibrate determinors, or automatically adjust analysis to a basis of one less determinor, and/or automatically implement back-up inspection of goods, optionally saving images for further analysis, or culling units of product. Digitized visual images represent pixels and pixel combinations. The method contemplates analyzing the pixel representations with at least two determinations of the parameter in respective at least two areas of the image, optionally for at least two parameters at respective replication sites, using software interpretation of selected areas of the visual image.

Other References

  • Acquiring and Displaying Images, COGNEX, pp. 34-35, 136-138, 143, 146-148, 153-154, and 530. Date unknown. but by April 1999
  • "User's Manual Model 1012," Kodak Ektapro EM Motion Analyzer, Eastman Kodak Company, 1990. pp. 1.1-7.9. Month not give
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