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Automatic manufacturing evaluation method and system

Patent 6223092 Issued on April 24, 2001. Estimated Expiration Date: Icon_subject March 24, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Automatic manufacturability evaluation method and system
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Tool which automatically produces an abstract specification of a physical system and a process for producing a physical system using such a tool
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Issued on: 03/31/1998
Inventor: Guignet

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Inventors

Assignee

Application

No. 823810 filed on 03/24/1997

US Classes:

700/103, Constraints or rules700/97, Design or planning700/99, Resource allocation700/100, Job scheduling700/101, Priority ordering705/9, Staff scheduling or task assignment706/919Designing, planning, programming, CAD, CASE

Examiners

Primary: Grant, William
Assistant: Rodriguez, Saul

Attorney, Agent or Firm

Foreign Patent References

  • 88480026 EP. 09/13/1988
  • 91111408 EP. 07/13/1991

International Class

G06F 019/00

Foreign Application Priority Data

1990-02-14 JP

Abstract

A designed object workability evaluating system for evaluating quantitatively at a stage of designing an article whether a structure of the article as designed can be realized with work easy to do in a manufacturing stage for thereby selectively determining a best structure from a plurality of design plans through comparative evaluation thereof. A server machine section of the system includes an evaluation-destined element estimating module for estimating the evaluation-destined elements to be performed on parts constituting an article given by a design plan subjected to evaluation, a part workability evaluation module for evaluating easiness of works to be performed on the parts, an article workability evaluation module for evaluating easiness of works involved in realizing the article, and a best design plan selection/determination module for selectively determining a best structure on the basis of comparative evaluation of a plurality of design plans.

Other References

  • Managing Distributed Engineering Databases, Machine Design, Jun. 21, 1990, pp. 42-47
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  • Statistical Control of VLSI Fabrication Process, IEEE, Mozumder and Strojwas, Feb. 1990
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