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Semiconductor memory device with reduced power consumption and stable operation in data holding state

Patent 6185144 Issued on February 6, 2001. Estimated Expiration Date: Icon_subject December 6, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Semiconductor memory device capable of setting the magnitude of substrate voltage in accordance with the mode
Patent #: 5694365
Issued on: 12/02/1997
Inventor: Nakai

Semiconductor memory device having controllable supplying capability of internal voltage
Patent #: 5699303
Issued on: 12/16/1997
Inventor: Hamamoto, et al.

Maintaining data integrity in DRAM while varying operating voltages
Patent #: 5712825
Issued on: 01/27/1998
Inventor: Hadderman, et al.

Semiconductor memory device and memory system
Patent #: 5818784
Issued on: 10/06/1998
Inventor: Muranaka, et al.

Dynamic semiconductor memory device with SOI structure and body refresh circuitry
Patent #: 5822264
Issued on: 10/13/1998
Inventor: Tomishima, et al.

Semiconductor memory device having controllable supplying capability of internal voltage
Patent #: 5841705
Issued on: 11/24/1998
Inventor: Hamamoto, et al.

DRAM with reduced electric power consumption
Patent #: 5867438
Issued on: 02/02/1999
Inventor: Nomura, et al.

Semiconductor memory device
Patent #: 5877978
Issued on: 03/02/1999
Inventor: Morishita, et al.

Semiconductor memory device with reduced power consumption and stable operation in data holding state Patent #: 6026043
Issued on: 02/15/2000
Inventor: Suzuki

Inventor

Application

No. 455461 filed on 12/06/1999

US Classes:

365/222, Data refresh365/185.22, Verify signal365/189.09, Including reference or bias voltage generator365/189.11, Including level shift or pull-up circuit365/204Accelerating charge or discharge

Examiners

Primary: Nguyen, Viet Q.

Attorney, Agent or Firm

Foreign Patent References

  • 36 87 533 T2 DE. 03/13/1986
  • 691 23 302 T2 DE. 07/13/1991
  • 196 13 667 A1 DE. 04/13/1996
  • 0 196 586 B1 EP. 08/13/1986
  • 0 469 587 A2 EP. 07/13/1991
  • 2-156499 JP. 06/13/1990
  • 8-329674 JP. 12/13/1996
  • 09219092 JP. 08/13/1997

International Class

G11C 011/24

Foreign Application Priority Data

1997-09-16 JP

Abstract

The semiconductor memory device has a normal operation mode and a self-refresh mode, and includes a VBB generation circuit generating a first substrate voltage when an internal power supply voltage is larger than a predetermined value and a second substrate voltage of an absolute value smaller than that of the first substrate voltage when VCC is smaller than the predetermined value, a bit line equivalent voltage generation circuit outputting voltage VCC /2 produced by resistive dividing when internal power supply voltage is lower than the predetermined value in self-refresh mode, a 4KE signal generation circuit generating a signal for performing a 4K operation in the self-refresh mode when internal power supply voltage is lower than the predetermined value and a refresh address generation circuit.

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