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Design verification method for programmable logic design

Patent 6182020 Issued on January 30, 2001. Estimated Expiration Date: Icon_subject January 30, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

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Inventor

Application

No. 227293 filed on 04/13/1994

US Classes:

702/117, Of circuit324/76.11MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE

Examiners

Primary: Cuchlinski, William A. Jr.

Attorney, Agent or Firm

International Class

G01R 031/14

Abstract

A technique for checking a logic design for compliance with a set of design rules in a computer-aided logic design system. An initial logic design is provided in computer-readable form in a logic design file. A set of design rules expressing permitted and prohibited structural and functional logic device relationships is provided as a portion of a logic design simulation system capable of synthesizing the initial design into a simulated network list. The initial design is checked against the various design rules incorporated into the set, and any violation of the design rules by the initial logic design is visibly displayed to the user. In one mode of operation, a list of user selectable optional rules is visibly displayed. A hierarchy of levels of design compliance is also displayed for user selection. For some design rules, a comparison can be made with the synthesized version of the initial logic design in order to spot design rule violations introduced by the synthesis process.

Other References

  • Takashima, Makoto et al., "Programs for Verifying Circuit Connectivity of MOS/LSI Mask Artwork", 19th Design Automation Conference, 1982, pp. 544-550
  • Chen, Liang-Gee et al., "Hierarchical Functional Verification for Cell-Based Design Styles", IEEE Proceedings, vol. 134, Part G, No. 2, Apr. 1987, pp. 103-109
  • Agrawal, Vishwani D, "Synchronous Path Analysis in MOS Circuit Simulator", 19th Design Automation Conference, 1982, pp. 629-635
  • Varma, Prab, "TDRC--A Symbolic Simulation Based Design for Testability Rules Checker", International Test Conference 1990, Paper 46.1, pp. 1055-1064, Sep. 1990
  • Spickelmier, Rick L., et al., "Critic: A Knowledge-Based Program for Critiquing Circuit Designs", 1988 IEEE International Conference on Computer Design: VLSI in Computers & Processors, pp. 324-327, Oct. 1988
  • Beachler, Robert K., "Design Tools for "Max"-Imizing TTL Integration", Wescon 1988, 14/2, pp. 1-5, Nov. 198
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