Model-based diagnostic system with automated procedures for next test selection
Patent 6167352 Issued on December 26, 2000. Estimated Expiration Date: 
June 26, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 26, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesAlgorithm for identifying tests to perform for fault isolation Malicious fault list generation method Patent #: 5561762 InventorsApplicationNo. 882791 filed on 06/26/1997US Classes:702/81, Quality evaluation714/33Derived from analysis (e.g., of a specification or by stimulation)ExaminersPrimary: Peeso, Thomas R.International ClassG01R 031/00AbstractA model-based diagnostic system that enables selection of components for replacement and selection of the next test to apply to a device under test based on economic costs associated with replacing components and conducting tests.Field of SearchQuality evaluation | |
