System for measuring noise figure of a radio frequency device
Patent 6114858 Issued on September 5, 2000. Estimated Expiration Date: 
October 28, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 28, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesApparatus for measuring noise factor and available gain Noise parameter determination method Measuring noise figure and y-factor Method and apparatus for measuring electrical noise in devices Patent #: 5970429 InventorAssigneeApplicationNo. 181940 filed on 10/28/1998US Classes:324/616, Gain or attenuation324/614Signal to noise ratio or noise figureExaminersPrimary: Metjahic, SafetAssistant: Nguyen, Viet Q. Attorney, Agent or FirmInternational ClassG01S 007/40AbstractNoise factor of a radio-frequency device under test (DUT) is determined by driving the input of the DUT with a randomly modulated sine wave and measuring the power of a resulting DUT OUTPUT signal within each of a set of equally-sized frequency bands. The noise factor is computed as a combination of the power of the modulated sine wave within each of a plurality of frequency bands and the measured power of the DUT OUTPUT signal within that same plurality of frequency bands.Field of SearchNoiseSignal to noise ratio or noise figure Circuit interference (e.g., crosstalk) measurement Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio) Including related electrical parameter By signal quality (e.g., signal to noise ratio) Signal-to-noise ratio Correction of deleterious effects | |
