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US Patent 6114858 - System for measuring noise figure of a radio frequency device

US Patent Issued on September 5, 2000
Estimated Patent Expiration Date: Icon_subject October 28, 2018Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
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Abstract

Noise factor of a radio-frequency device under test (DUT) is determined by driving the input of the DUT with a randomly modulated sine wave and measuring the power of a resulting DUT OUTPUT signal within each of a set of equally-sized frequency bands. The noise factor is computed as a combination of the power of the modulated sine wave within each of a plurality of frequency bands and the measured power of the DUT OUTPUT signal within that same plurality of frequency bands.

Inventor

Assignee

Application

No. 181940 filed on 10/28/1998

US Classes:

324/616, Gain or attenuation324/614Signal to noise ratio or noise figure

Field of Search

324/613, Noise324/614, Signal to noise ratio or noise figure324/628, Circuit interference (e.g., crosstalk) measurement702/69, Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)702/65, Including related electrical parameter455/135, By signal quality (e.g., signal to noise ratio)455/226.3, Signal-to-noise ratio359/337Correction of deleterious effects

Examiners

Primary: Metjahic, Safet
Assistant: Nguyen, Viet Q.

Attorney, Agent or Firm

US Patent References

4491783, Apparatus for measuring noise factor and available gain
Issued on: 01/01/1985
Inventor: Sawayama ,   et al.
4905308, Noise parameter determination method
Issued on: 02/27/1990
Inventor: Davidson
5191294, Measuring noise figure and y-factor
Issued on: 03/02/1993
Inventor: Grace, et al.
5970429Method and apparatus for measuring electrical noise in devices
Issued on: 10/19/1999
Inventor: Martin

International Class

G01S 007/40

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