Method of standard-less phase analysis by means of a diffractogram
Patent 6108401 Issued on August 22, 2000. Estimated Expiration Date: 
December 18, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 18, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod and apparatus for the determination of electron density in a part volume of a body Quantitative determination of mineral composition by powder X-ray diffraction Quantitative analysis of the active table ingredient by power x-ray diffractometry Examination method for the evaluation of location-dependent spectra Patent #: 5812630 InventorApplicationNo. 216255 filed on 12/18/1998US Classes:378/83, Composition analysis378/71DiffractometryExaminersPrimary: Porta, David P.Attorney, Agent or FirmInternational ClassG01N 023/00Foreign Application Priority Data1997-12-22 EPAbstractA method of determining the concentrations of the constituents in a mixture of substances by way of an X-ray diffractogram of the mixture. The fundamental difficulty that it is not possible to determine the entire power spectrum (PS) of the diffraction is avoided by making a suitable estimate of the PS on the basis of the diffractions that can be observed. Using an estimate of the dispersive power of the individual atoms in the unity cells of the constituents and the PS, the absolute intensities are determined from the relative intensities and on the basis thereof the concentrations of the constituents in the mixture are determined.Other References
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