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US Patent 6101450 - Stress analysis using a defect-free four-node finite element technique

US Patent Issued on August 8, 2000
Estimated Patent Expiration Date: Icon_subject June 3, 2017Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
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Abstract

Stress, strain and displacement in two-dimensional regions can be calculated by computerized techniques. In the x-y plane, a region is discretized into four-node finite elements such as quadrilaterals and triangles with side nodes. Each such element has eight distinct deformation modes. These correspond to three rigid-body displacements, three uniform strain profiles for compressible materials or two deviatoric strain fields accompanied by an isotropic pressure for incompressible materials, and two flexures. Pointwise equilibrium requires the bending shapes to be functions of Poisson's ratio. Nodal equilibrium and compatibility are satisfied for prescribed loads implementing exact differentiation and integration. Element volume change parameters for compressible materials or isotropic pressure for incompressible materials are eliminated, and a linear system of equations is formed in terms of the seven remaining unknowns per element employing a neural-network solution strategy to pass simultaneously the patch and zero-locking tests. The strain and stress distributions including isotropic pressure for incompressible materials, and displacement profiles are solved as x-y polynomials. This technique, Tessellica, can be used in computer-aided design, and can be integrated in subsequent manufacture or construction of buildings, bridges, dams, ships, aircraft and automobiles, for example, and in bioengineering applications.

Inventor

Application

No. 868238 filed on 06/03/1997

US Classes:

702/42, Stress or strain measurement356/32, MATERIAL STRAIN ANALYSIS356/35.5, By light interference detector (e.g., interferometer)702/11Formation characteristic

Field of Search

702/11, Formation characteristic702/42, Stress or strain measurement707/3, Query processing (i.e., searching)345/420, Solid modelling345/423, Tessellation428/366, Including boron or compound thereof (not as steel)106/644, Fiber bar or wire containing73/597, Velocity or propagation time measurement73/37, WITH FLUID PRESSURE356/32, MATERIAL STRAIN ANALYSIS356/35.5By light interference detector (e.g., interferometer)

Examiners

Primary: Trammell, James P.
Assistant: Nguyen, Hoang

Attorney, Agent or Firm

US Patent References

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Issued on: 03/14/1978
Inventor: Morley
4979992, Compact reinforced composite
Issued on: 12/25/1990
Inventor: Bache
5408882, Ultrasonic device and method for non-destructive evaluation of polymer composites
Issued on: 04/25/1995
Inventor: McKinley, et al.
5417103, Method of determining material properties in the earth by measurement of deformations due to subsurface pressure changes
Issued on: 05/23/1995
Inventor: Hunter, et al.
5438402, System and method for measuring the interface tensile strength of planar interfaces
Issued on: 08/01/1995
Inventor: Gupta
5440674, Mesh generation with quasi-equilateral triangulation for finite element analyses
Issued on: 08/08/1995
Inventor: Park
5524636, Method and apparatus for elasticity imaging
Issued on: 06/11/1996
Inventor: Sarvazyan, et al.
5737277, Method for computing borehole geometry from ultrasonic pulse echo data
Issued on: 04/07/1998
Inventor: Priest
5774124, Finite element modeling method and computer system for converting a triangular mesh surface to a quadrilateral mesh surface
Issued on: 06/30/1998
Inventor: Itoh, et al.
5796617Method and apparatus for manufacturing a prosthesis having optimized response characteristics
Issued on: 08/18/1998
Inventor: St. Ville

International Classes

G01L 001/24
G01B 011/16

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