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Dielectric materials of amorphous compositions of TI-O2 doped with rare earth elements and devices employing same

Patent 6093944 Issued on July 25, 2000. Estimated Expiration Date: Icon_subject June 4, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Vapor-deposition material for the production of high-refraction optical coatings
Patent #: 5340607
Issued on: 08/23/1994
Inventor: Friz, et al.

Method of making conductive amorphous-nitride barrier layer for high-dielectric-constant material electrodes
Patent #: 5585300
Issued on: 12/17/1996
Inventor: Summerfelt

Mixed oxide high index optical coating material and method
Patent #: 5989626
Issued on: 11/23/1999
Inventor: Coombs, et al.

Dielectric ceramic composition and dielectric resonator using the same Patent #: 6025291
Issued on: 02/15/2000
Inventor: Murakawa

Inventor

Application

No. 090295 filed on 06/04/1998

US Classes:

257/310With high dielectric constant insulator (e.g., Ta 2 O 5 )

Examiners

Primary: Crane, Sara W.

Attorney, Agent or Firm

International Class

H01L 027/108

Abstract

A dielectric film useful for a capacitor in a DRAM device comprises an amorphous composition of Ti1-y My Ox, where y is approximately in the range 0.01 to 0.50, x is approximately 1.0 to 2.0, and M is a lanthanide rare earth element and advantageously, selected from the group of neodymium (Nd), terbium (Tb) and dysprosium (Dy). The concentration of dopants in the a-TiO2 film is preferably from 5 to 50 at. % and more preferably from 10 to 30 at. %. The inventive dielectric materials have a high dielectric constant of greater than 30 and figure of merit of greater than 9.0 μC/cm2.

Other References

  • Gartner, M., et al., Spectroellipsometric characterization of lanthanide-doped TiO2 films . . ., Thin Solid Films, 234 (1993) 561-
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