U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Point-scanning luminescent microscope

Patent 6088097 Issued on July 11, 2000. Estimated Expiration Date: Icon_subject January 14, 2019. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method and apparatus for optical micro manipulation
Patent #: 5363190
Issued on: 11/08/1994
Inventor: Inaba, et al.

Field synthesis and optical subsectioning for standing wave microscopy
Patent #: 5394268
Issued on: 02/28/1995
Inventor: Lanni, et al.

Confocal microscope system
Patent #: 5557452
Issued on: 09/17/1996
Inventor: Harris

Arrangement for confocal fluorescence microscopy
Patent #: 5751417
Issued on: 05/12/1998
Inventor: Uhl

Device for coupling the radiation of short-pulse lasers in an optical beam path of a microscope Patent #: 5995281
Issued on: 11/30/1999
Inventor: Simon, et al.

Inventor

Application

No. 231902 filed on 01/14/1999

US Classes:

356/318, Monochromatic (e.g., laser)250/458.1LUMINOPHOR IRRADIATION

Examiners

Primary: Evans, F. L.

Attorney, Agent or Firm

Foreign Patent References

  • 0 718 656 EP. 06/12/1996
  • 37 42 806 DE. 07/12/1989
  • 42 28 366 DE. 03/12/1994
  • 43 38 578 DE. 05/12/1994
  • 195 10 102 DE. 10/12/1996

International Class

G01J 021/64

Foreign Application Priority Data

1998-01-14 DE

Abstract

A point-scanning luminescent microscope, especially for studying biological objects, has at least one collimated light source for producing an excitation light beam, an optical arrangement which focuses the light of the excitation light source on an object to be studied, at least one detector arrangement for acquiring light emitted by the object, an optical arrangement which collects the light emitted by the object and supplies it to the detector arrangement, and a scanner arrangement which causes relative movement between the scanning light beam and the object in at least two directions. The scanner arrangement has piezoactuators for achieving scanning movements between the scanning light beam and object. The detector arrangement can have a surface sensor which forms a confocal diaphragm. The light source can be designed to deliver rectangular pulses. When the microscope is designed for twin-photon fluorescent microscopy, an objective lens is provided for illuminating the object and can be is used, at the same time, for collecting some of the photons emitted by the object, and a second detector is provided behind a condenser lens of the objective lens.

Other References

  • Patent Abstracts of Japan 09203739, Aug. 5, 1997, Nikon Corp., English Abstract
  • Patent Abstracts of Japan 07311029, Nov. 28, 1995, Hitachi Constr Mach Co Ltd, English Abstract
  • Patent Abstracts of Japan 07174768, Jul. 14, 1995, Olympus Optical Co Ltd, English Abstract
  • Patent Abstracts of Japan 07134132, May 23, 1995, Olympus Co Ltd, English Abstrac
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