Optical web defect detection system
Patent 6084681 Issued on July 4, 2000. Estimated Expiration Date: 
December 8, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 8, 2018. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References H1616 3206606 3453053 3612702 3618063 3693021 3859538 Detection of blemishes in surfaces Optical-electrical web inspection system Flaw detecting method and apparatus InventorApplicationNo. 207449 filed on 12/08/1998US Classes:356/430, For flaws or imperfections356/238.2Elongated textile product (e.g., thread, yarn, etc.)ExaminersPrimary: Rosenberger, Richard A.Attorney, Agent or FirmInternational ClassG01N 021/898AbstractAn optical web defect detection system includes a light source and a detector disposed with respect to the light source so that the detector receives light modulated by a web moving proximate the light source. The detector outputs a signal corresponding to the modulated light. The detector may include a plurality of fiber optic elements having ends arranged in a group aligned generally parallel to the orientation of a defect in the web. A control mechanism is in operative communication with the detector to receive the signal therefrom. The control mechanism may include a signal processing stage and a defect detection stage that receives a signal modified by the signal processing stage and compares the modified signal to a predetermined criteria to determine whether a defect occurs in the web. The control mechanism may automatically adjust the signal processing stage to modify the attribute with respect to the criteria so that the defect detection stage thereafter identifies a predetermined change in the attribute of the modified signal as a defect.Other References
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