U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Thermal processor for semiconductor wafers

Patent 6067931 Issued on May 30, 2000. Estimated Expiration Date: Icon_subject November 4, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3372672

3665139

Incandescent light source with transparent heat mirror
Patent #: 4160929
Issued on: 07/10/1979
Inventor: Thorington ,   et al.

Incandescent electric lamp with etalon type transparent heat mirror
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Photo-assisted CVD
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Inventor: Allred ,   et al.

Chemical vapor deposition coating process employing radiant heat and a susceptor
Patent #: 4496609
Issued on: 01/29/1985
Inventor: McNeilly ,   et al.

Induction heated reactor system for chemical vapor deposition
Patent #: 4579080
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Inventor: Martin ,   et al.

Selective chemical vapor deposition apparatus
Patent #: 4653428
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Inventor: Wilson ,   et al.

Method and apparatus for substrate heating in an axially symmetric epitaxial deposition apparatus
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Issued on: 03/31/1987
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Semiconductor substrate heater and reactor process and apparatus
Patent #: 4938815
Issued on: 07/03/1990
Inventor: McNeilly

More ...

Inventors

Application

No. 743587 filed on 11/04/1996

US Classes:

118/725, Substrate heater118/724, By means to heat or cool219/385, Combined with container, enclosure, or support for material to be heated219/405, Including heat energy reflecting or directing means392/411, Lamp banks (i.e., array of plural lamps)392/416With chamber

Examiners

Primary: Lund, Jeffrie R.

Attorney, Agent or Firm

Foreign Patent References

  • 4026728A1 DE. 02/13/1992
  • 59-94829 JP. 05/13/1984
  • 60-74425 JP. 04/13/1985
  • 61-1017 JP. 01/13/1986
  • 61-129834 JP. 06/13/1986
  • 4074-859 JP. 03/13/1992
  • 07029844 JP. 01/13/1995
  • 072452374 JP. 09/13/1995

International Classes

C23C 016/00
F27D 001/00

Abstract

A thermal processor for at least one semiconductor wafer includes a reactor chamber having a material substantially transparent to light including a wavelength within the range of about 200 nanometers to about 800 nanometers for holding the at least one semiconductor wafer. A coating including a material substantially reflective of infrared radiation can be present on at least a portion of the reactor chamber. A light source provides radiant energy to the at least one semiconductor wafer through the coating and the reactor chamber. The light source can include an ultraviolet discharge lamp, a halogen infrared incandescent lamp, or a metal halide visible discharge lamp. The coating can be situated on an inner or outer surface of the reactor chamber. If the reactor chamber has inner and outer walls, the coating can be situated on either the inner wall or the outer wall.

Other References

  • Grant, Julius, Hackh's Chemical Dictionary, p. 346, 1969
  • Besancon, Robert M., The Encyclopedia of Physics, Third Edition, pp. 588-591, Oct. 1991
  • "Effect of Infrared Transparency on the Heat Transfer Through Windows: A Clarification of the Greenhouse Effect," SD Silverstein, Science, vol. 193, Jul. 16, 1976
  • "Antimony-Doped Tin Oxide Films Deposited by the Oxidation of Tetramethyltin and Trimethylantimony," TP Chow; M. Ghezzo, BJ Baliga, J. Electrochem. Soc.: Solid-State Science and Technology, May 1982, pp. 1040-1045
  • "Temperature Measurement in a Furnace-Heated RTP System," Chunghsin Lee, Solid-State Technology, Apr. 1993
  • "A Continuous Heat Source--Rapid Thermal Processor," C. Lee, AB Wittkower, Semiconductor Fabtech 94
  • Spectral Emissivity of Silicon, Tsutomu Sato, The Research Institute for Scientific Measurements, Tohoku University, Gojyo-Dori, Sendai, Nov. 2, 1966, pp. 339-347
  • "Emissivity of Silicon at Elevated Temperatures," PJ Timans, J. Applied Phys. 74 (10) Nov. 15, 1993, pp. 6353-6364
  • "The Effect of Multilayer Patterns on Temperature Uniformity During Rapid Thermal Processing," Jeffrey P. Hebb, Klavs F. Jensen, J. Electrochem. Soc., vol. 143, No. 3, Mar. 1996, pp. 1142-1151
  • "Rapid Thermal Processing Systems," Ronald E. Sheets, Microelectronic Manufacturing and Testing, Jul. 1985, pp. 16-18
  • "Optical Properties of Tin-Doped Indium Oxide Determined by Spectroscopic Ellipsometry," Tobias Gerfin, Michael Gratzel, J. Applied Phys. 79 (3) Feb. 1, 1996, pp. 1722-1729
  • "Equipment Performance Issues in Rapid Thermal Processing," Walter Thurston, Richard Seaman, Microelectronic Manufacturing and Testing, Jul. 198
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