Computer aided inspection machine
November 6, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMethod of automatically measuring the shape of a continuous surface External lead shape measurement apparatus for measuring lead shape of semiconductor package by using stereoscopic vision Method and apparatus for determining surface profile and/or surface strain Triangulation-based 3D imaging and processing method and system Multi-purpose fishing pliers Method of utilizing edge images of a circular surface for detecting the position, posture, and shape of a three-dimensional objective having the circular surface part Patent #: 5867592 InventorsApplicationNo. 965542 filed on 11/06/1997US Classes:382/154, 3-D or stereo imaging analysis348/125, Flaw detector356/603, Projection of structured light pattern356/613, Silhouette382/141Manufacturing or product inspectionExaminersPrimary: Boudreau, Leo H.Assistant: Mehta, Bhavesh M. Attorney, Agent or FirmInternational ClassesG06K 009/00G01B 011/24 AbstractAn automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.Field of SearchRange or distance measuringManufacturing or product inspection 3-D or stereo imaging analysis Pattern boundary and edge measurements Shape and form analysis Mapping 2-D image onto a 3-D surface Measuring image properties (e.g., length, width, or area) Fault or defect detection Alignment, registration, or position determination Surface texture or roughness measuring Three-dimension Manufacturing Electronic circuit chip or board (e.g., positioning) Position detection Alignment or positioning Flaw detector Of electronic circuit chip or board Of transparent container or content (e.g., bottle, jar, etc.) Of surface (e.g., texture or smoothness, etc.) By comparison with reference object With stored representation of reference object Profile With triangulation | |
