U.S. patents available from 1976 to present.
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Furnace for rapid thermal processing with optical switching film disposed between heater and reflector

Patent 6047107 Issued on April 4, 2000. Estimated Expiration Date: Icon_subject December 19, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Emissivity independent temperature measurement systems
Patent #: 5226732
Issued on: 07/13/1993
Inventor: Nakos, et al.

Rapid thermal processing apparatus and method
Patent #: 5561735
Issued on: 10/01/1996
Inventor: Camm

Hydrogen-activated thin film switching device
Patent #: 5635729
Issued on: 06/03/1997
Inventor: Griessen, et al.

Bistable switching device containing gadolinium hydride Patent #: 5652433
Issued on: 07/29/1997
Inventor: Ouwerkerk, et al.

Inventors

Application

No. 994153 filed on 12/19/1997

US Classes:

392/416, With chamber118/724, By means to heat or cool219/390, Muffle-type enclosure359/273Particular electrochromic layer structure

Examiners

Primary: Jeffery, John A.

Attorney, Agent or Firm

Foreign Patent References

  • 4142466A1 DE. 06/13/1993
  • 9638758 WO. 12/13/1996

International Classes

G02F 003/02
H03K 017/78

Foreign Application Priority Data

1996-12-20 EP

Abstract

A furnace (1) for Rapid Thermal Processing of a wafer (7), characterized in that the wafer (7) is heated by lamps (9), and the heat radiation is reflected by an optical switching device (15,17) which is in the reflecting state during the heating stage. During the cooling stage of the wafer (7), the heat is absorbed by the switching device (15,17), which is in the heat-absorbing state. The switching device comprises a switching film of a trivalent metal, such as gadolinium, which is capable of forming hydrides by an exchange of hydrogen. Dependent on the hydrogen concentration of the hydrides, the film reflects or absorbs heat. The hydrogen content in the switching film can be changed by varying the partial pressure of hydrogen, or, preferably, by varying the potential of the switching film forming part of a stack of layers in an electrochemical cell.

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