Patent ReferencesMethod and device for compensating for differences in sensitivities to incident radiation of a luminescent layer and a transducer Image detection device having correction circuit for removing artifacts due to delayed charge transfer Patent #: 5530238 InventorAssigneeApplicationNo. 903883 filed on 07/31/1997US Classes:250/370.11, Scintillation system250/252.1, CALIBRATION OR STANDARDIZATION METHODS250/363.09, With calibration250/370.09, X-ray or gamma-ray system250/371MethodsExaminersPrimary: Hannaher, ConstantineAttorney, Agent or FirmForeign Patent References
International ClassG01T 001/16Foreign Application Priority Data1996-08-01 DEAbstractIn a method for correcting the image errors arising during an x-ray diagnostic measurement from the memory effect of a radiation-sensitive structure, particularly in the form of a photodiode array, of a solid-state detector which receiving the x-rays, given a change in the operating mode with a change of the radiation dose, a correction image is determined that is subtracted from the detector image obtained from the solid-state detector. For determining the correction image, at least one image signal supplied by the solid-state detector substantially immediately before or after the change in the operating mode, and thus the change of the radiation dose, is registered, this being subsequently weighted with at least one decay curve measured substantially synchronously with the pick-up of at least the image signal supplied immediately before the change, and substantially corresponding to the chronological decay behavior of the electrical charge in the radiation-sensitive structure of the solid-state detector of the image signal. | |