Patent ReferencesMethod and means to cancel diffraction effects from radiation fields Hyperresolution optical system Amplitude optical modulator using a two-electrode DFB laser structure Superresolution scanning optical device Surface feature mapping using high resolution C-scan ultrasonography Optical system with reduced focus spot size Super-resolution scanning optical system by incoherently superimposing two beams Surface feature mapping using high resolution C-scan ultrasonography Patent #: 5689576 InventorsAssigneeApplicationNo. 128611 filed on 08/03/1998US Classes:359/276, Amplitude modulation73/614, Of signals to pass only echoes from within test body246/264, POINT THROWERS359/246, Modulation of polarized light via modulating input signal359/558, DIFFRACTION359/562, For changing zeroth order intensity382/124Using a fingerprintExaminersPrimary: Ben, LohaAttorney, Agent or FirmInternational ClassG02F 001/01AbstractAn ultra high resolution wave focusing method and apparatus is disclosed. The invention provides a focusing system having an effective numerical aperture greater than that possible using known conventional focusing techniques. By the method and apparatus of the invention, a wave of arbitrary wavefront profile and wavelength λ is focused to a region of high amplitude having a spot size that approaches the fundamental limit of 0.25λ. Imaging and patterning systems employing such a wave focusing method and apparatus provide ultra high resolution and ultra small feature sizes beyond the capabilities of systems utilizing conventional focusing elements.Other References
Field of SearchAmplitude modulationModulation of polarized light via modulating input signal Light wave temporal modulation (e.g., frequency, amplitude, etc.) By reflection Pulse modulation Toroidal For changing zeroth order intensity DIFFRACTION Using a fingerprint Of signals to pass only echoes from within test body With signal analyzing or mathematical processing | |