Method for determining a reliability parameter of a responsive system, and a corresponding signal processing system

Patent 6012147 Issued on January 4, 2000. Estimated Expiration Date:

September 10, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Abstract Claims Description Full Text

Patent References

Reliability model generator
Patent #: 5014220
Issued on: 05/07/1991
Inventor: McMann, et al.

Transparent testing of integrated circuits
Patent #: 5469445
Issued on: 11/21/1995
Inventor: Nicolaidis

Automated testing system
Patent #: 5490249
Issued on: 02/06/1996
Inventor: Miller

Method for system-prompted fault clearance of equipment in communcation systems
Patent #: 5513312
Issued on: 04/30/1996
Inventor: Loebig

Method of testing and predicting failures of electronic mechanical systems Patent #: 5581694
Issued on: 12/03/1996
Inventor: Iverson, et al.

Inventors

Assignee

Siemens Aktiengesellschaft

Application

No. 926718 filed on 09/10/1997

US Classes:

714/1Reliability and availability

Examiners

Primary: Beausoliel, Robert W. Jr.
Assistant: Baderman, Scott

Attorney, Agent or Firm

Lerner; Herbert L., Greenberg; Laurence A.

Foreign Patent References

0 416 370 A2 EP. 03/13/1991

International Class

G06F 011/00

Foreign Application Priority Data

1995-03-10 DE

Abstract

A method and a responsive system for signal processing, particularly a system of the safety instrumentation and control of a nuclear power plant. A first database stores the association of the data processing units, data transmission units, and computer programs of the system, as well as a sequence of steps in the automatic signal processing in accordance with an integral processing specification. A second database stores in memory operating parameters and at least one reliability parameter of each data processing unit and each data transmission unit. The contents of the databases are utilized in a reliability module, which determines the reliability characteristic of the responsive system from the data of the first database and the second database. If and when the reliability parameters change, a transmission takes place to the reliability module, so that in each case an updated reliability parameter may be determined. As a result, the currently valid availability of the responsive system can be learned at any point in time, taking into account the high degree of detailing of the system.

Other References

"Large Scale Integration: technology, applications and impacts" (Lawson et al.), fourth Euromicro symposium on microprocessing and microprogramming, Oct. 17-19, 1978, Munich, pp. 159, 175-183
"Validating Data from Smart Sensors" (Manus Henry), 699 Control Engineering 41, Aug. 1994, No. 9, Newton, MA, US, pp. 63-6