Tester for LSI devices and memory devices
Remap method and apparatus for a memory system which uses partially good memory devices
Memory tester having concurrent failure data readout and memory repair analysis
Semiconductor memorizing device
Failure information processing in automatic memory tester
Memory module, method for control thereof and method for setting fault bit table for use therewith
Universal burn-in driver system and method therefor
Apparatus and method for specifying the flow of test execution and the binning for a testing system
Semiconductor memory having test circuit and test method thereof
Semiconductor memory system with the function of the replacement to the other chips
ApplicationNo. 716947 filed on 09/20/1996
US Classes:714/8Isolating failed storage location (e.g., sector remapping)
ExaminersPrimary: Beausoliel, Robert W. Jr.
Assistant: Elmore, Stephen C.
Attorney, Agent or Firm
International ClassG06F 011/00
AbstractA new method for masking off failing memory locations on a Single In-line Memory Module (SIMM) involves reading out identification (ID) codes fused in individual DRAMs. The ID codes are used to index stored fail maps taken from the DRAMs prior to their assembly onto a SIMM. After all failing locations of all of the DRAMs located on a single SIMM are determined, the SIMM is then programmed to re-route these locations to auxiliary memory located on the SIMM.
Field of SearchBad bit