System for measuring gap and mismatch between opposing parts
Patent 5999265 Issued on December 7, 1999. Estimated Expiration Date: 
December 2, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 2, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesSystem for measuring shapes and dimensions of gaps and flushnesses on three dimensional surfaces of objects Apparatus and process for measuring gap and mismatch Patent #: 5416590 InventorsAssigneeApplicationNo. 982830 filed on 12/02/1997US Classes:356/614, POSITION OR DISPLACEMENT250/559.24, Transversal measurement (e.g., width, diameter, cross-sectional area)356/608, Scan356/613SilhouetteExaminersPrimary: Font, Frank G.Assistant: Nguyen, Tan T. Attorney, Agent or FirmForeign Patent References
International ClassG01B 011/29Foreign Application Priority Data1996-12-02 FRAbstractA system for measuring gap and mismatch by optical triangulation projects two parallel light planes onto the parts to be characterized so as to form two brightness lines. The three-dimensional profiles of the parts are calculated along the brightness lines. Raw values of gap and mismatch are calculated, preferably using particular reference points and lines. These raw values are then corrected by reference to the separation between the light planes and the change in position of a reference point of the profile of one of the parts from one brightness line to the other.Other References
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