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Virtual monitor debugging method and apparatus

Patent 5983017 Issued on November 9, 1999. Estimated Expiration Date: Icon_subject November 12, 2016. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Debugger operable with only background monitor
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Inventors

Assignee

Application

No. 745526 filed on 11/12/1996

US Classes:

717/129, Using breakpoint703/13, SIMULATING ELECTRONIC DEVICE OR ELECTRICAL SYSTEM703/23, EMULATION714/30, Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)714/46, Operator interface for diagnosing or testing714/724, Digital logic testing716/4Testing or evaluating

Examiners

Primary: Hafiz, Tariq R.
Assistant: Dam, Tuan Q.

Foreign Patent References

  • 0652516 EP 05/13/1995
  • 0720093 EP 07/13/1996
  • 2266606 GB 11/13/1993
  • 2289147 GB 11/13/1995

International Classes

G06F 011/00
500.44
527

Abstract

A virtual monitor controller includes a data storage device coupled to receive and output data; an instruction storage device coupled to receive and output instructions; a status storage device coupled to receive and output status data; and a mode storage device coupled to receive and output mode data. The virtual monitor controller is included in a debugger/monitor controller. A debugger/monitor system comprises a host system; the debugger/monitor controller; and a digital processor. Preferably, the controller is coupled between the processor and IC logic. A method of operating a virtual monitor comprises the steps of intercepting an instruction fetch from a microprocessor; downloading instructions from a host computer; and operating the microprocessor with the instructions. Preferably, the instructions are sequentially downloaded.

Other References

  • Winters, M. "Using IEEE-1149.1 For In-Circuit Emulation," Conference Record of WESCON/94, Idea/Microelectronics, pp. 525-528, Sep. 1994
  • Chenoweth et al. "Embedding Virtual Test Points in PCBs," Conference Record of WESCON/94, Idea/Microelectronics, pp. 529-533, Sep. 199
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