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Process for producing semiconductor article

Patent 5966620 Issued on October 12, 1999. Estimated Expiration Date: Icon_subject November 14, 2017. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Method of producing tandem solar cell devices from sheets of crystalline material
Patent #: 4816420
Issued on: 03/28/1989
Inventor: Bozler ,   et al.

Semiconductor member and process for preparing semiconductor member
Patent #: 5371037
Issued on: 12/06/1994
Inventor: Yonehara

Process for the production of thin semiconductor material films
Patent #: 5374564
Issued on: 12/20/1994
Inventor: Bruel

Method for preparing semiconductor member
Patent #: 5374581
Issued on: 12/20/1994
Inventor: Ichikawa, et al.

Method for placing semiconductive plates on a support
Patent #: 5559043
Issued on: 09/24/1996
Inventor: Bruel

Method for manufacturing semiconductor substrate
Patent #: 5773355
Issued on: 06/30/1998
Inventor: Inoue, et al.

Method for producing semiconductor substrate Patent #: 5854123
Issued on: 12/29/1998
Inventor: Sato, et al.

Inventors

Assignee

Application

No. 970356 filed on 11/14/1997

US Classes:

438/455, BONDING OF PLURAL SEMICONDUCTOR SUBSTRATES257/E21.237, Mechanical treatment, e.g., grinding, polishing, cutting (EPO)257/E21.32, Of silicon on insulator (SOI) (EPO)257/E21.568, With separation/delamination along ion implanted layer, e.g., "Smart-cut", "Unibond" (EPO)257/E21.57, With separation/delamination along porous layer (EPO)438/458Subsequent separation into plural bodies (e.g., delaminating, dicing, etc.)

Examiners

Primary: Picardat, Kevin M.

Attorney, Agent or Firm

Foreign Patent References

  • 553852A2 EP. 08/19/1993
  • 0767486 EP. 04/19/1997
  • 5-21338 JP. 01/19/1993
  • 5211128 JP. 08/19/1993
  • 7302889 JP. 11/19/1995
  • 8213645 JP. 08/19/1996

International Classes

H01L 021/30
H01L 021/46

Foreign Application Priority Data

1996-11-15 JP

Abstract

A novel process for producing a semiconductor article is disclosed which comprises the steps of preparing a first substrate constituted of a silicon substrate, a nonporous semiconductor layer formed on the silicon substrate, and an ion implantation layer formed in at least one of the silicon substrate and the nonporous semiconductor layer; bonding the first substrate to a second substrate to obtain a multiple layer structure with the nonporous semiconductor layer placed inside; separating the multiple layer structure at the ion implantation layer; and removing the ion implantation layer remaining on the separated second substrate.

Other References

  • M. Bruel, "Application of hydrogen ion beams to Silicon On Insulator material technology", Nucl. Instr. and Meth. in Phys. Res., vol. 108 (1996), pp. 313-319
  • Q. Tong, "Semiconductor wafebonding: recent developments", Materials Chem. and Phys., vol. 37 (Mar. 1994), pp. 101-127
  • Patent Abstracts of Japan, vol. 016, No. 166 (E-1193), Apr. 22, 1992 (JP 04-014705)
  • B. Aspar, "Transfer of structured and patterned thin silicon films using the Smart-Cut process", Elect. Letters, vol. 32 (Oct 10, 1996)
  • Imai, "Crystalline Quality of Silicon Layer Formed by FIPOS Technology", J. Crystal Growth, vol. 63, No. 3, pp. 547-553 (1983)
  • Maszara, "Silicon-On-Insulator by Wafer Bonding: A Review", J. Electrochem. Soc., vol. 138, No. 1, pp. 341-347 (1991)
  • Harendt, "Silicon on Insulator Material by Wafer Bonding", J. Elect. Mater., vol. 20, No. 3, pp. 267-277 (1991)
  • Baumgart, "Light Scattering Topography Characterization of Bonded SOI Wafers", Extended Abstract of ECS First International Symposium of Wafer Bonding, pp. 375-385 (1991)
  • Hunt, "Thinning of Bonded Wafers: Etch-Stop Approaches", Extended Abstract of ECS First International Symposium of Wafer Bonding, pp. 165-173 (1991)
  • Yonehara, "Epitaxial layer transfer by bond and etch back of porous Si", Appl. Phys. Lett., vol. 64, No. 16, pp. 2108-2110 (1994
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